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A Dommann

Empa-Swiss Federal Laboratories, Switzerland

Title: New X-ray imaging developments to characterize ceramic materials for dental applications

Biography

Biography: A Dommann

Abstract

The workshop concentrates on a novel technique that has demonstrated great potential for non-destructive testing (NDT) and non-destructive evaluation (NDE). This method uses the Talbot-Lau grating interferometer principle. It enables X-ray insights extended by two additional contrast mechanisms: X-ray phase contrast imaging (XPCI) and scatter dark field imaging (SDFI). Conventional radiographic systems, based on the absorption of x-rays in the sample, have limited contrast for light materials such as polymers and biological tissues. XPCI, on the other hand, is able to reveal subtle changes in the microstructure of the samples, such as micro-cracks in composite.